OPI-160 LED WAFER-LEVEL MEASUREMENT SYSTEM
´Ù¾çÇÑ Ç׸ñÀ» °£ÆíÇÏ°Ô ÃøÁ¤, User interface(ÁÖ¹®Çü ¼ÒÇÁÆ®¿þ¾î ¼³°è°¡´É) ¿þÀÌÆÛ ¼öÁØ¿¡¼ ÇÊ¿äÇÑ ±¤ÇÐÀû,Àü±âÀû, ¿ÂµµÀÇÁ¸¼º ÅëÇÕÃøÁ¤, ÃøÁ¤ÀÇ ÀÚµ¿È ¹× Æí¸®ÇÑ »ç¿ëÀÚ È¯°æ, °í¹èÀ² Çö¹Ì°æ ¹× Ä«¸Þ¶ó¸¦ ÅëÇÑ °üÂû
- ´Ù¾çÇÑ Ç׸ñÀ» °£ÆíÇÏ°Ô ÃøÁ¤, User Interfae(ÁÖ¹®Çü ¼ÒÇÁÆ®¿þ¾î ¼³°è°¡´É)
- ¤ýOptical Measurement
- Spectrum, Peak/Dominant wavelength(¥ëp, ¥ëd), CIE Color Coordinate(Cx, Cy »öÁÂÇ¥), Luminous Intensity(Iv,±¤µµ),
- Correlated Color Temperature(CCT(Tc), »ó°ü»ö ¿Âµµ), Color Rendering Index(CRI(Ra), ¿¬»ö¼º), CIE XYZ(»ïÀÚ±ØÄ¡),
- Radiant Flux, Luminous Flux(Àü±¤¼Ó), Spatial Intensity Distribution(¹è±¤, ÁöÇâ°¢)
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- ¤ýElectrical Measurement
- Forward/ Reverse Current[lf, lr], Forward/Reverse Voltage[Vf, Vr], l-V-L Sweep
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- ¤ýTemperature Dependence Measurement
- Temperature.VS.Electrical/optical Test
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- ¤ýCurrent Spreading and Degradation Analysis
- Real time Image analysis of LED using CCD Camera and beam profiler software
- ¿¬±¸°³¹ß¿¡ ÃÖÀû
- ¤ý¿þÀÌÆÛ ¼öÁØ¿¡¼ ÇÊ¿äÇÑ ±¤ÇÐÀû/Àü±âÀû/¿ÂµµÀÇÁ¸¼º ÅëÇÕ ÃøÁ¤
- ¤ýÃøÁ¤ÀÇ ÀÚµ¿È ¹× Æí¸®ÇÑ »ç¿ëÀÚ È£³ª°æ
- ¤ý°í¹èÀ² Çö¹Ì°æ ¹× Ä«¸Þ¶ó¸¦ ÅëÇÑ Chip Current spreading°ú degradationÀÇ °üÂû
- ¤ý¸¹Àº ¿¬±¸Àڵ鿡 ÀÇÇÑ ÇÊ¿äÇÑ ±â´É ÅëÇÕ ¹× °ËÁõ
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- ¤ý(CIE)±¹Á¦Á¶¸íÀ§¿øȸ ÃøÁ¤¸ðµå ¹× Çѱ¹Ç¥ÁØ°úÇבּ¸¼Ò Ç¥ÁØ°ª ¼Ò±Þ
- ¤ýKeithley 2612À» ÀÌ¿ëÇÑ °íÁ¤¹Ð ÃøÁ¤
- ¤ýTE Cooled 2048 pixel CCD ¼¾¼¸¦ ÀÌ¿ëÇÑ Àú³ëÀÌÁî, °íÁ¤¹Ð, °íÀçÇö¼º ±¸Çö
- ¤ýÃøÁ¤µ¥ÀÌÅ͸¦ ºÐ¼® ¹× Á¤¸®, ÁßøÇÏ¿© 2Â÷¿ø, 3Â÷¿ø ±×·¡ÇÁ¿Í µ¥ÀÌÅ͸®½ºÆ®·Î ¹è±¤Æ¯¼º Ç¥Çö
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