Easy to measure various items, User interface (Support on-demand SW design), integrated measurement of optical, electrical and thermal dependency required in wafer level, automation of measurement and convenient user environment, observation using high r
It is program that automatically counts the number of chips with features; video processing speed : 10 sec/ 2inch wafer, input of model name, serial number, operator name, set up, save, open and modify condition for various chips.
Simultaneously measure optical and electrical property of high output LED to the change of temperature. Measure performance of high output single and multi chip LED.Measure optical and eelectrical properties at the same time, rapidly control temperature a
Simultaneously measure optical and electrical property of high output LED to the change of temperature.Measure performance of high output single and multi chip LED.Measure optical and eelectrical properties at the same time, rapidly control temperature an
Measure thermal property of LED according to change of temperature in normal or excessive conditions and analyze change of optical and electrical property in accordance with change of temperature in normal.
Connect various mass-production equipment (Sorter.Prover.Handler) to tester. Provide user friendly interface and Under Photometer function. Automatically save collected data as Excel file and statistical processing.
Measure optical/electrical/thermal properties for various high output, multi-chip, and module LED/OLED as well as current stressing and measurement. Support up to 3A and consecutive/pulse type
형광물질
