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    • opi-170

    • led eip chip wafer
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    • Universal LED Tester System comsists of Cryo cooler system for controlling extreme temperature and Integrating Sphere System
         for measuring total luminous flux or total radiant flux of chip
    • Cryo cooler system is a chamber in which pieces of epi and chip wafer or single LED are put together. And this system is able to
         measure optical / electrical characteristics of sample freely wihtin temperature of 10K~380K
         [temperature resolving power is 0.1]
    • Probe station is able to measure optical / electrical characteristics of epi and chip wafer
    • Integrating Sphere System of 6 inch measures Luminos intensity depending on emperature variations with cryo cooler system,
         and calculates photoelectric efficiency and total luminos fluc and total radiant flux of chip SED attached to TOCAN
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    • Optical characteristics measurement items
    • Spectral characteristics : peak wavelength, primary wavelength, medium wavelength, central wavelength, Full Width Half Max,
         color coordinate, color purity, color temperature, Color rendering index
    • Radiational intensity : Luminous intensity, intensity radiation, total luminous flux and total radiant flux.
    • Electrical characteristics measurement items
    • Fprward current, backward voltage, backward current and backward voltage
    • Sweep measurement Current-voltage, Voltage-current, Current-luminous characteristics, Temperature- electricity and
         Temperature-luminous
    • Measurement for spectral characteristics using high sensitivity, high resolution spectrometer It uses Integrating Sphere System-
         typed input photometer and spectrometer for stable Luminous intensity
    • Current supply fof measuring electrical characteristics using high speed and high precision sourcemeter is allowed up to 3A,
         and continuous and pulse-typed output is available


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    • Sweep measurement : current-voltage, voltage-current, current-light Sweep
    • Measuring electrical, luminous characteristics depending on time
    • Various spectral areas(UV, UV-VIS, VIS, VIS-IR)are selectable
    • Variious power supply (voltage, current and pulse) and measurement ranges are selectable using Keithley2430 Sourcemeter
    • Special functions can be added based on customer requirement (Optional)
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    • Measuring multiple chips are allowed to be performed for individual or all channel simultaneously.
    • Various conditional measurements
    •    Repeated Aging Time measurement: after aging sample for certain time, and one time measurement is performed by repeated times
    •    Constant time interval aging time measurement: after aging sample for certain time, measurement is performed by constant time
         interval
    • Measured data is stored (CSV file) so as to recognize variations of optical / electrical characteristics intuitively.
    • Temperature variation data depending on time is stored (data and picture)
    • For managing measurement condition, storing it into project file or retrieving it from project file is available
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    • Providing standard measurement mode of International Commission on Illumination and KS
    • Correction by standard lamp and LED which is retroactive from Korea Research Institute of Standards and Science
    • Correction agent of Korea Reserch Institute of Standards and Science (KRISS)(Optional)
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    • User-centric setup and user guide
    • Software development based on customer requirement
    • Providing new measurement method and information via LED standard consortium and International Commission on Illumination
         and Luminous intensity measurement club activities
    • Rapid A/S
    • Support for JIG to help various sample measurement
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    • Specifications
      Voltage Range 1V ~ 105V
      Current Range 100pA to 3.5A, 10A[Pulse Only]
      Setting Temperature 9K to 390K Resolution 0.1
      PD Temperature Choice of 20 to 30, fixing
      Spectrometer 350 to 900nm, 2048 CCD array Type
      Optical Head 50mm integrating Sphere
      Photodiode 350 to 900nm, 10 Area
      Dimension 2,400mm[W] x 1,200mm[D] x 1,800mm[H]

    LED measurement system and equipment | Withlight

    Withlight Co., Ltd is a professional enterprise of measurement devices to measure the various properties of LED (Light Emitting Diode), OLED, PD, LD, Display and other common light sources and manufactures and sells more than 30 kinds of measurement system and measurement equipment; especially, Withlight has pride as the top technology leading company in LED measurement system in the country. Based on accumulated rich knowledge on machinery, electronics, optics, software and commercialization capability, Withlight has realized customer satisfaction in light and semiconductor device measurement area and continues its step to provide best services as a leading LED measurement equipment company in the world.

    We have been supplying various measurement system and equipment such as LED Lighting test equipment, LED thermal test equipment, chip counter, LED EL test equipment, illumination test equipment, solar cell test equipment, photodiode test equipment, integrating sphere system, goniophotometer, mirror goniometer, goniometer system, LED reliability test, etc. to most of major companies and research institutes in domestic market and enjoying good reputation from customers

    Withlight's LED test equipment is delivered to almost all the fields requiring LED test equipment such as domestic large enterprises and research institutes and are favorable commented by relate engineers; Withlight collects customers' opinions and introduces new products through participation in domestic/overseas exhibition such as LED EXPO every year.
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    LED Lighting Test | LED thermal test | LED measurement system | LED measurement equipment | Chip counter | LED test equipment | LED EL test | Illumination test | Solar cell test | Photodiode test |
    Integrating sphere system | Mirror goniometer | Goniophotometer | Goniometer system | LED reliability test

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