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    • OPI-175LED EL TEST SYSTEM

      LED EL Test System OPI-175 is for measuring both electrical and optical characteristics of LED epi wafer
      LED EL Test
    • ¤ýMeasuring Electroluminescence for LED epi wafer
    • ¤ýMeasuring light emission for upper / lower wafer using glass, measurement sensors in upper and lower area.
    • ¤ýIt enables wafer to be moved to xyz direction using knobs considering covenience for contact work and productivity as
         much as possible.
    • ¤ýLuminous header has exact photo-deteciting power using 2 inch's Lamp Measurement System
    • ¤ýImproving precision of measurement by using both Luminous intensity meter and spectrometer simultaneously
    • ¤ýProviding software environment considering user's convenience as much as possible
    • ¤ýOptical characteristics measurement items
    •  - Spectral characteristics: peak wavelength, primary wavelength, medium wavelength, central wavelength, Full Width Half
          Max, color coordinate, color purity, color temperature, Color rendering index
    •  - Intensity of radiation: Luminous intensity, intensity radiation
    • ¤ýElectrical characteristics measurement items
         Forward current, backward voltage, backward current and backward voltage
    • ¤ýSweep measurement
        Current-voltage, Voltage-current, Current-luminous characteristics
    • ¤ýMeasurement for spectral characteristics using high sensitivity, high resolution spectrometer
    • ¤ýIt uses Integrating Sphere System-typed input photometer and spectrometer for exact and stable Luminous intensity by
         correcting color of PD on real time basis.
    • ¤ýCurrent supply for measuring electrical characteristics using high speed and high precision sourcmeter is allowed up to 1A
    • ¤ýSweep measurement : current-voltage, voltage-current, current-light
    • ¤ýVarious spectral areas(UV, UV-VIS, VIS, VIS-IR)are selectable
    • ¤ýVarious power supplies (voltage and current) using Keithley2400 Sourcemeter and measurement ranges are selectable
    • ¤ýSpecial functions can be added based on customer requirement(optional)
    • ¤ýIntuitively recognizing measurement resul
         It displays measured spectrum. color coordinate and measurement result list
         Summarized Graph display for each measurement item Mapping display
    • ¤ý Setting various conditions
         User selection for optical and electrical characteristic item
         Sweep measurement set up
    • ¤ýGrade set up function
    • ¤ýIndividual or total value storing for measured value in upper/lower sensor
    • ¤ýMeasured date is stored (CSV file) so that variations is measurement for optical / electrical characteristic are intuitively
         recognized
    • ¤ýFor managing measurement conditions, they can be stored of retrieved from project file
    • ¤ýProviding standard measurement mode of International Commission on Illumination and KS
    • ¤ýUse of PD which is poven to have relative spectral sensitivity efficiency by korea Reserch Institute of Standards and Science
    • ¤ýCorrection by standard lamp and LED which is retroactive from Korea Research Institute of Standards and Science
    • ¤ýCorrection agent of Korea Research Institute of Standards and Science (KRISS) (Optional)
    • ¤ýUser-centric setup and user guide
    • ¤ýSoftware development based on customer requiirement
    • ¤ýProviding new measurement method and information via LED standard consortium and Internationl Commission on Illumination
         and Luminous intensity measurement club activities
    • ¤ýRapid A/S
    • ¤ýSupport for JIG to help various sample measurement
    • Specifications
      Voltage Range
      ¡¾1§Å ~ ¡¾105V
      Current Range
      ¡¾100pA to ¡¾3.5A. ¡¾10A(Pulse Only)
      Setting Temperature 9K to 390K Resolution 0.1¡É
      PD Temperature
      Choice of 20¡É to 30¡É. fixing
      Spectrometer
      350 to 830nm, 2048 CCD array type
      Optical Head
      50mm Integrating Sphere
      Photodiode
      380 to 950nm, 10§± Area
      Oimension
      2,400mm(W) x 1,200mm(D) x 1,800mm(H)