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    • OPI-160WAFER LEVEL LED MEASUREMENT SYSTEM

      OPI-160 Wafer Level LED Measurement System is simple to measure various items and is available to
      design custom-tailored software.
      LED Measurement System
    • ´Ù¾çÇÑ Ç׸ñÀ» °£ÆíÇÏ°Ô ÃøÁ¤, user interface(ÁÖ¹®Çü ¼ÒÇÁÆ®¿þ¾î ¼³°è°¡´É)
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    • ¤ýOptical Measurement
    •    Spectrum, Peak/Dominant wavelength(¥ëp, ¥ëd), CIE Color Coordinate(Cx, Cy), Luminous Intensity(Iv),
    •    Correlated Color Temperature(CCT(Tc), Correlated color temperature), Color Rendering Index(CRI(Ra), Color rendering ability),
         CIE XYZ, Radiant Flux, Luminous Flux, Spatial Intensity Distribution(light distribution, directional angle)
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    • ¤ýElectrical Measurement
    •    Forward/ Reverse Current[lf, lr], Forward/Reverse Voltage[Vf, Vr], l-V-L Sweep
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    • ¤ýTemperature Dependence Measurement
    •    Temperature.VS.Electrical/optical Test
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    • ¤ýCurrent Spreading and Degradation Analysis
    •    Real time Image analysis of LED using CCD Camera and beam profiler software
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    • ¤ýIntegrated measurement for optical / electrical / temperature dependency necessary for wafer level
    • ¤ýAutomated measurement and convenient user environment
    • ¤ýObservation of Chip Current spreading and degradation via high magnification microscope and camera
    • ¤ýIntegrated functions and proven functions by many of researchers
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    • ¤ýCIE measurement mode and applied standard value of Korea Research Institute of Standards and Science retroactively
    • ¤ýHigh precision measurement using Keithley 2612
    • ¤ýLow noise, high precision and high productivity by TE Cooled 2048 pixel CCD sensor
    • ¤ýIt expresses characteristics of light distribution with 2, 3-dimensional graphs and data list by analyzing,
         sorting and overlapping measured data
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