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HOME > Product > LED > Chip LED > LED Measurement System OPI-160
OPI-160
WAFER LEVEL LED MEASUREMENT SYSTEM
OPI-160 Wafer Level LED Measurement System is simple to measure various items and is available to
design custom-tailored software.
¤ýOptical Measurement
Spectrum, Peak/Dominant wavelength(¥ëp, ¥ëd), CIE Color Coordinate(Cx, Cy), Luminous Intensity(Iv),
Correlated Color Temperature(CCT(Tc), Correlated color temperature), Color Rendering Index(CRI(Ra), Color rendering ability),
CIE XYZ, Radiant Flux, Luminous Flux, Spatial Intensity Distribution(light distribution, directional angle)
¤ýElectrical Measurement
Forward/ Reverse Current[lf, lr], Forward/Reverse Voltage[Vf, Vr], l-V-L Sweep
¤ýTemperature Dependence Measurement
Temperature.VS.Electrical/optical Test
¤ýCurrent Spreading and Degradation Analysis
Real time Image analysis of LED using CCD Camera and beam profiler software
¤ýIntegrated measurement for optical / electrical / temperature dependency necessary for wafer level
¤ýAutomated measurement and convenient user environment
¤ýObservation of Chip Current spreading and degradation via high magnification microscope and camera
¤ýIntegrated functions and proven functions by many of researchers
¤ýCIE measurement mode and applied standard value of Korea Research Institute of Standards and Science retroactively
¤ýHigh precision measurement using Keithley 2612
¤ýLow noise, high precision and high productivity by TE Cooled 2048 pixel CCD sensor
¤ýIt expresses characteristics of light distribution with 2, 3-dimensional graphs and data list by analyzing,
sorting and overlapping measured data