HOME > PRODUCT > Devices(LED/OLED) > OPI-160{}WAFER-LEVEL LED MEASUREMENT SYSTEM
OPI-160 WAFER-LEVEL LED MEASUREMENT SYSTEM
Easy to measure various items, User interface (Support on-demand SW design), integrated measurement of optical, electrical and thermal dependency required in wafer level, automation of measurement and convenient user environment, observation using high r
Easy to measure various items, User interface (Support on-demand SW design)
ㆍOptical Measurement
Spectrum, Peak/Dominant wavelength(λp, λd), CIE Color Coordinate(Cx, Cy), Luminous Intensity(cd), Correlated Color Temperature(CCT(Tc)), Color Rendering Index(CRI(Ra)), CIE XYZ(), Radiant Flux(mW), Luminous Flux(lm), Spatial Intensity Distribution(IES, LDT)